Commission A: Electromagnetic Metrology

COMMISSION A : Electromaganetic Metrology ( November 2004 - October 2007 )

Attosecond Metrology and Spectroscopy

The origin of attosecond metrology is linked to the advent of ultrashort mode locked laser sources femtosecond lasers, chirped pulse amplification, carrier-envelope-phase stabilization and the technological aspects of this development that rendered experiments with a temporal resolution of tens of attoseconds possible. The high-order harmonicgeneration process yields laser pulses in the wavelen...

Digital Demodulation of Interferometric Signals

The marriage of optical sensing techniques with sophisticated digital signal processing has resulted in a myriad of practical metrology systems. Optical metrology systems offer many attractive measurement features. These systems are inherently non-contacting, nondestructive, and immune from electromagnetic interference. In addition, since light is used as the sensing probe, the measurement syst...

Electromagnetic Nanoscale Metrology Based on Entropy Production and Fluctuations

The goal in this paper is to show how many high-frequency electromagnetic metrology areas can be understood and formulated in terms of entropy evolution, production, and fluctuations. This may be important in nanotechnology where an understanding of fluctuations of thermal and electromagnetic energy and the effects of nonequilibrium are particularly important. The approach used here is based on...

Fundamental units: physics and metrology

The problem of fundamental units is discussed in the context of achievements of both theoretical physics and modern metrology. On one hand, due to fascinating accuracy of atomic clocks, the traditional macroscopic standards of metrology (second, metre, kilogram) are giving way to standards based on fundamental units of nature: velocity of light c and quantum of action h. On the other hand, the ...